| Title | XRD and FT-IR characterisation of hydroxyapatite sputtered films on titanium |
| Publication Type | Conference Paper |
| Year of Publication | 2004 |
| Authors | Silva, RA, Sousa, M, Monteiro, FJ, Barrai, R, Lopes, MA |
| Conference Name | Transactions - 7th World Biomaterials CongressTrans. World Biomater. Congr. |
| Date Published | 2004/// |
| Conference Location | Sydney |
| ISBN Number | 1877040193 (ISBN); 9781877040191 (ISBN) |
| Keywords | Absorption bands, Adsorption, Bioactive films, Biomaterials, Bone, crystal structure, Crystallinity, Deposition, Fourier transform infrared spectroscopy, hydroxyapatite, Hydroxyapatite films, morphology, Scanning electron microscopy, Sintering, Sputtering, Surface topography, Thin films, Titanium, X ray diffraction analysis |
| Abstract | XRD and FT-IR were used to characterize hydroxyapatite (HA) films, which were prepared using rf sputtering. The morphology of the sample films was analyzed using SEM. From the FT-IR spectrum, sputtered HA films showed structural changes, namely the decrease of the strength of the liberational mode of OH group, indicating the presence of a poorly crystalline phase. XRD results of films obtained at 500 W and 400 W showed that the crystallinity of the 500 W 4h e 2h samples was low, just showing a very incipient degree of crystalline structural structural arrangement, while in the 400 W-4h and 2h samples there was no crystalline structure, with only a slight diffraction of the 002 and 301 HA planes. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-13844280872&partnerID=40&md5=4b0c92bd00c80cb724aa79ae88c5976e |
