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1998
Cattarin, S., Chazalviel, J. - N., Da Fonseca, C., Ozanam, F., Peter, L. M., Schlichthörl, G., & Stumper, J. (1998). In situ characterization of the p-Si/NH 4F interface during dissolution in the current oscillations regime . Journal of the Electrochemical SocietyJ Electrochem Soc, 145(2), 498 - 502.
Chazalviel, J. - N., Da Fonseca, C., & Ozanam, F. (1998). In situ infrared study of the oscillating anodic dissolution of silicon in fluoride electrolytes. Journal of the Electrochemical SocietyJ Electrochem Soc, 145(3), 964 - 973.